Monitoring crystal dissolution at nanometer resolution using laser reflectometry

Citation
Pj. Eggington et Ag. Taylor, Monitoring crystal dissolution at nanometer resolution using laser reflectometry, J CRYST GR, 208(1-4), 2000, pp. 525-532
Citations number
33
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
208
Issue
1-4
Year of publication
2000
Pages
525 - 532
Database
ISI
SICI code
0022-0248(200001)208:1-4<525:MCDANR>2.0.ZU;2-7
Abstract
Laser reflectometry has been used for the first time as an in situ real-tim e monitor of the dissolution of the (0 0 1) face of KClO3 crystals into aqu eous solution. During the dissolution process the reflected light was subje ct to constructive and destructive interference caused by the movement of c rystal boundaries. This produced Fabry-Perot oscillations similar to the wi dely exploited phenomenon used in the laser reflectometry-based metrology o f semiconductor surfaces. The method is adapted and theoretical fits to the observed data are presented. The quality of the data allows dissolution ra tes of 100 nm s(-1) to be measured accurately. Data gained by this method w as used to verify the concentration dependence of the dissolution rate and confirm it as a diffusion-controlled mechanism. The hydrodynamic radius of the diffusing ions was found to be 0.224 nm, in agreement with literature v alues. The potential of laser reflectometry for use as an effective probe s ensitive to changes in crystal surface morphology during dissolution has al so been demonstrated. (C) 2000 Elsevier Science B.V. All rights reserved.