R. Schaublin et al., Quantitative analysis of CTEM images of small dislocation loops in Al and stacking fault tetrahedra in Cu generated by molecular dynamics simulation, J NUCL MAT, 276, 2000, pp. 251-257
The visibility of conventional transmission electron microscopy (CTEM) imag
es of small crystalline defects generated by molecular dynamics (MD) simula
tion is investigated. Faulted interstitial dislocation loops in Al smaller
than 2 nm in diameter and stacking fault tetrahedra (SFT) in Cu smaller tha
n 4 nm in side are assessed. A recent approach allowing to simulate the CTE
M images of computer generated samples described by their atomic positions
is applied to obtain bright field and weak beam images. For the dislocation
loop-like cluster it appears that the simulated image is comparable to exp
erimental images. The contrast of the g(3.1g) near weak beam image decrease
s with decreasing size of the cluster but is still 20% of the background in
tensity for a 2 interstitial cluster. This indicates a visibility at the li
mit of the experimental background noise. In addition, the cluster image si
ze, which is here always larger than the real size, saturates at about 1 nm
when the cluster real size decreases below 1 nm, which corresponds to a cl
uster of 8 interstitials. For the SFT in Cu the g(6.1g) weak beam image is
comparable to experimental images. It appears that the image size is larger
than the real size by 20%. A large loss of the contrast features that allo
ws to identify an SFT is observed on the image of the smallest SFT (21 vaca
ncies). (C) 2000 Elsevier Science B.V. All rights reserved.