DETERMINATION OF THE THICKNESS AND OPTICAL-CONSTANTS OF ZNIN2SE4 THIN-FILMS USING TRANSMISSION SPECTRUM

Transmission spectra of ZnIn2Se4 thin films grown by thermal evaporati on technique on to glass substrate, maintained at 200 degrees C, have been measured. The interference fringes were used to calculate the ref ractive index and the average thickness of thin films. The variation i n refractive index with wavelength has been fitted to the single-oscil lator model. The band gap width calculated from the absorption coeffic ient was found to decrease with increasing film thickness.