Wd. Ma et al., Preparation of perovskite structure K(Ta0.65Nb0.35)O-3 films by pulsed laser deposition on Si substrates, PHYS ST S-A, 176(2), 1999, pp. 985-990
Highly oriented and perovskite structure KTN (potassium tantalate-niobate)
thin films were fabricated by pulsed laser deposition technique on Si(100)
substrates. The surface of the thin films is homogeneous, crack-free and de
nse. The ferroelectric measurement was carried out on metal-ferroelectric-m
etal capacitors and the remanent polarization and the coercive field were 8
.66 mu C/cm(2) and 7.44 kV/cm, respectively. The effects of the substrate t
emperature, laser energy density on the target and oxygen pressure during t
he deposition process on the structure of thin films were discussed.