Effects of shallowness on the development of free-surface mixing layers

Citation
Wsj. Uijttewaal et R. Booij, Effects of shallowness on the development of free-surface mixing layers, PHYS FLUIDS, 12(2), 2000, pp. 392-402
Citations number
21
Categorie Soggetti
Physics
Journal title
PHYSICS OF FLUIDS
ISSN journal
10706631 → ACNP
Volume
12
Issue
2
Year of publication
2000
Pages
392 - 402
Database
ISI
SICI code
1070-6631(200002)12:2<392:EOSOTD>2.0.ZU;2-I
Abstract
The development of two shallow mixing layers with different water depths is analyzed experimentally by means of laser Doppler anemometry. The experime nts show that bottom friction plays an important role in the growth of the mixing layer width and in the strength and dimensions of the large quasi tw o-dimensional turbulence structures therein. It is found in this study that the initial growth rate of both mixing layers is similar to what has been found for deep water plane mixing layers. Further downstream the reduction of the growth rate can be ascribed to the decrease of the velocity differen ce between the two ambient streams in combination with the suppression of t he growth of the large turbulence structures. In the most shallow mixing la yer considered, the influence of the bottom friction is dominant, impeding the further growth of the mixing layer width. It is demonstrated that the r educed mixing layer growth is related to a loss of coherence in the large t urbulence structures. This loss of coherence also reduces the characteristi c length-scale that establishes the lateral mixing of matter and momentum i n the mixing layer. Eventually the water depth becomes the dominant length scale that determines the characteristic motion of the turbulence in that c ase. From the energy density spectra of the turbulence fluctuations and fro m the phase relation between the two velocity components in the horizontal plane it is concluded that large structures contribute most to the exchange of momentum in the mixing layer and thus to the Reynolds-stresses. (C) 200 0 American Institute of Physics. [S1070-6631(00)00502-X].