On the formation mechanism of gamma-AgI thin films

Citation
Ps. Kumar et al., On the formation mechanism of gamma-AgI thin films, THIN SOL FI, 357(2), 1999, pp. 111-118
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
357
Issue
2
Year of publication
1999
Pages
111 - 118
Database
ISI
SICI code
0040-6090(199912)357:2<111:OTFMOG>2.0.ZU;2-O
Abstract
Programmed iodization of silver foils at ambient temperature and pressure l eads to the formation of gamma-AgI films with zinc-blende structure. Gravim etric experiments show that the AgI film formation follows a parabolic time dependence. X-ray diffraction monitoring of the film formation on unanneal ed, annealed and etched silver foils reveals that the absence of intrinsic stacking faults is a necessary condition for the formation of gamma-AgI thi n films and that the presence of such faults invariably results in the form ation of beta-AgI thin films. Optical absorption studies indicate eventual saturation of the direct optical band gap with increase in iodination time, which corroborates Xray diffraction and gravimetry results. (C) 1999 Elsev ier Science S.A. All rights reserved.