Self-assembled formation of ZnCdSe quantum dots on atomically smooth ZnSe surfaces on GaAs(001) by molecular beam epitaxy

Citation
K. Arai et al., Self-assembled formation of ZnCdSe quantum dots on atomically smooth ZnSe surfaces on GaAs(001) by molecular beam epitaxy, THIN SOL FI, 357(1), 1999, pp. 1-7
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
357
Issue
1
Year of publication
1999
Pages
1 - 7
Database
ISI
SICI code
0040-6090(199912)357:1<1:SFOZQD>2.0.ZU;2-Q
Abstract
We investigate growth conditions to obtain atomically flat ZnSe film surfac es on GaAs(001) without forming ZnSe-related dot structures. It is found th at high temperature growth is favorable for the growth of ZnSe with a smoot h surface. In order to prevent degradation of interface properties at high substrate temperature, two-step growth of ZnSe layers is employed, where a low-temperature growth step is followed by high temperature growth. The two -step process enables one to grow ZnSe with atomically flat surface without ZnSe-related dots structures. The formation of self-assembled ZnCdSe quant um dots (QDs) is achieved on such atomically surfaces. Typical QD size is: base diameter of 21 +/- 3 nm and height of 8 +/- 2 nm, Even at a total depo sition of ZnCdSe of 3.5 monolayer (ML), the QD density is as low as similar to 2.4 mu m(-1). It is found that these QDs are formed on a ZnCdSe wetting layer whose thickness is at least 3 ML. (C) 1999 Elsevier Science S.A. All rights reserved.