Composition dependent structural properties of Pb1-xEuxSe thin films

We report on the composition dependent structural properties of Pb1-xEuxSe thin films deposited by a co-evaporation method. X-ray diffraction studies have shown that all the films deposited over a composition range of x = 0.1 to 0.45 are polycrystalline in nature with sharp diffraction peaks indepen dent of compositions and growth conditions. The lattice parameter of the fi lms calculated using the strongest reflection (200) has been found to devia te from Vegard's law at higher compositions. The grain sizes have been foun d to be in the range of 100-450 Angstrom with (200) as the preferred orient ation of the grains. The dependence of grain size and orientation on film c omposition and growth temperature has been studied in detail to understand the mechanisms governing the polycrystalline grain growth. The incorporatio n of europium and surface re-evaporation of selenium have been found to cri tically affect the polycrystalline grain growth. (C) 1999 Elsevier Science S.A. All rights reserved.