Nitrogenated diamond and carbon nitride films have been produced using ammn
onia as the source of atomic nitrogen. A feed mixture of C2H5OH + NH3 + H-2
was used in a hot filament CVD reactor. The deposition parameters were opt
imized for the growth of well-faceted crystals onto either SiO2 or undoped
diamond substrates. Film structure and morphology were studied using optica
l and atomic force microscopies, and Raman and photoluminescence spectrosco
pies. Three types of film, according to the deposition substrate used and t
he nitrogen doping, have been identified. All films presented semiconductor
characteristics and their deep and shallow activation energies have been d
etermined from resistance versus temperature measurements. (C) 1999 Elsevie
r Science S.A. All rights reserved.