The effect of nitrogen incorporation on the electrical properties of diamon
d is currently under intense study. In this work, diamond grown by hot fila
ment chemical vapor deposition was exposed to a radiofrequency (40 MHz glow
discharge of pure nitrogen for times of between 5 min and 1 h. The effect
of this exposure on the chemical and elemental composition of the samples w
as assessed by Raman and X-ray photoelectron spectroscopy. Changes in the e
lectrical resistance with increasing film nitrogenation and temperature wer
e measured. The scope and limitations of this approach to nitrogenation are
evaluated. (C) 1999 Elsevier Science S.A. All rights reserved.