About SIMS analysis of organic materials

The specific parameters of secondary ion mass spectrometry (SIMS) for each regime (static or dynamic) are summarised. The particular aspects of organi c material SIMS investigation are addressed, focusing on the analytical cho ices and problems. Examples of studies are proposed for both regimes, chose n either from the literature or amongst investigations conducted at CEMEF; they illustrate from a didactic viewpoint the interest of SIMS for the stud y of organic material surfaces.