Citation
Y. Li et al., Study on the oxidative characterization of LPE HgCdTe film surface by XPS, ACT PHY C E, 49(1), 2000, pp. 132-136
Citations number
5
Categorie Soggetti
Physics
Journal title
ACTA PHYSICA SINICA
ISSN journal
10003290
→ ACNP
Volume
49
Issue
1
Year of publication
2000
Pages
132 - 136
Database
ISI
SICI code
1000-3290(200001)49:1<132:SOTOCO>2.0.ZU;2-Z
Abstract
The liquid-phase epitaxial HgCdTe film surface oxidative characterization h
as been studied by X-ray photoelectron spectroscopy (XPS). HgCdTe surface e
xposed by various processing steps has been measured and analyzed. The resu
lts show that the native oxide film can be reduced and eliminated by the so
lution of lactic acid in glycol after etching by bromine in absolute alcoho
l. This indicates that the pre-treatment before HgCdTe surface passivation
affects the passivant/HgCdTe interface properties.