Switching properties of SrBi2Ta2O9 thin films produced by metalorganic decomposition

Citation
Xb. Chen et al., Switching properties of SrBi2Ta2O9 thin films produced by metalorganic decomposition, APPL PHYS L, 76(3), 2000, pp. 369-371
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
3
Year of publication
2000
Pages
369 - 371
Database
ISI
SICI code
0003-6951(20000117)76:3<369:SPOSTF>2.0.ZU;2-B
Abstract
The process of polarization reversal in a SrBi2Ta2O9 (SBT) thin film capaci tor produced by a metalorganic decomposition method was investigated. The s witching time (100-600 ns) and the reversible polarization have been measur ed at different voltages in the range of 0-5 V. It was found that by anneal ing the SBT sample in AR atmosphere at 400 degrees C, the switching times w ere significantly reduced. This indicates that oxygen vacancies in the film speed up nucleation and growth of new domains. (C) 2000 American Institute of Physics. [S0003-6951(00)04203-0].