The process of polarization reversal in a SrBi2Ta2O9 (SBT) thin film capaci
tor produced by a metalorganic decomposition method was investigated. The s
witching time (100-600 ns) and the reversible polarization have been measur
ed at different voltages in the range of 0-5 V. It was found that by anneal
ing the SBT sample in AR atmosphere at 400 degrees C, the switching times w
ere significantly reduced. This indicates that oxygen vacancies in the film
speed up nucleation and growth of new domains. (C) 2000 American Institute
of Physics. [S0003-6951(00)04203-0].