This work reports on the synthesis and characterization of NASICON prepared
from SiO2, Na3PO4. 12H(2)O and two types of zirconia: pure monoclinic ZrO2
and TZP (Tetragonal Polycrystalline Zirconia, with 3 mol% Y2O3) as raw mat
erials. The classical ceramic method was used in all cases. SEM, XRD and DT
A were used to follow the synthesis and sintering process, and impedance sp
ectroscopy (IS) was used to study the electrical properties of sintered pel
lets. Results obtained with different NASICON samples showed a significant
role of composition and processing conditions on the electrical properties.
Samples based on TZP, sintered at 1210 degrees C, exhibited densities Of a
bout 3.20 g/cm(3) (98% of theoretical density of NASICON) and ionic conduct
ivities of about 2x10(-3) S.cm(-1) at room temperature a rather interesting
result when compared with data obtained with the material prepared from pu
re ZrO2.