The development of piezoelectric sensors for high frequency requires to wor
k with very thin samples of material. At this thick nesses, the stress conc
entration produces strong perturbations in the materials, and the origin of
a non linear response, which depends field on working conditions. With the
goal to advance in the knowledgement of this phenomenon, and by using Comp
lex Impedance Spectroscopy, we have analysed the response of PZT ceramics w
ith thickness of microns as a function of the applied and the amplitude of
the analysis signal. These results allow to establish the base to the devel
opment of ultrasonic tunable sensors for high frequency.