Dynamic thermal ratings realize circuit load limits

Citation
Da. Douglass et al., Dynamic thermal ratings realize circuit load limits, IEEE COM AP, 13(1), 2000, pp. 38-44
Citations number
2
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE COMPUTER APPLICATIONS IN POWER
ISSN journal
08950156 → ACNP
Volume
13
Issue
1
Year of publication
2000
Pages
38 - 44
Database
ISI
SICI code
0895-0156(200001)13:1<38:DTRRCL>2.0.ZU;2-A