A new five-parameter MOS transistor mismatch model is introduced capable of
predicting transistor mismatch with very high accuracy for ohmic and satur
ation regions, including short-channel transistors. The new model is based
on splitting the contribution of the mobility degradation parameter mismatc
h ae into two components, and modulating them as the transistor transitions
from ohmic to saturation regions. The model is tested for a wide range of
transistor sizes (30), and shows excellent precision, never reported before
for such a wide range of transistor sizes, including short-channel transis
tors.