Prior to any attempt to model a charge transport mechanism, a precise knowl
edge of the parameters on which the current depends is essential. In this w
ork, the soft breakdown (SBD) failure mode of ultrathin (3-5 nm) SiO2 layer
s in polysilicon-oxide-semiconductor structures is investigated. This condu
ction regime is characterized by a large leakage current and by multilevel
current fluctuations, both at low applied voltages, In order to obtain a ge
neral picture of SBD, room-temperature current-voltage (I-V) measurements h
ave been performed on samples with different gate areas, oxide thicknesses,
and substrate types. An astounding matching between some of these I-V char
acteristics has been found. The obtained results and the comparison with th
e final breakdown regime suggest that the current now through a SBD spot is
largely influenced by its atomic-scale dimensions as occurs in a point con
tact configuration. Experimental data are also presented which demonstrate
that specific current fluctuations can be ascribed to a blocking behavior o
f unstable SBD conduction channels.