A gas pressure sensing device based on ZrO2 thin films for use at high temp
eratures is presented. The films were deposited on glass substrates through
electron beam evaporation of ZrO2 tablets in vacuum with residual oxygen p
ressure of the order of 10(-4) mbar. The piezoresistive characteristics of
the device for different pressures of N-2, CO2, Ar and He at different temp
eratures were investigated. The experimental results and the underlying phy
sical mechanisms are discussed.