Two commonly used statistical quality control charts, the c-chart and u-cha
rt, are unsatisfactory for monitoring high-yield processes with low defect
rates. To overcome this difficulty, a new type of control chart called the
cumulative quantity control chart (CQC-chart) is introduced in this paper.
The CQC-chart can be used no matter whether the process defect rate is low
or not, and when the process defect rate is low or moderate the CQC-chart d
oes not have the shortcoming of the c- and u-charts of showing up false ala
rm signals too frequently. The CQC-chart does not require rational subgroup
ing of samples (which is necessary for the c- and u-charts), and is appropr
iate for monitoring automated manufacturing processes.