Vn. Zabenkin et al., Magnetic flux distribution in type II superconductors with large demagnetization and a high edge barrier, JETP LETTER, 70(12), 1999, pp. 787-791
The trapped flux distribution in thin wafers of both polycrystalline and gr
anular superconductors having large demagnetization and edge barriers of di
fferent heights is measured by means of polarized neutrons. It is shown tha
t the nature of the critical state in polycrystalline wafers, unlike that i
n a ceramic wafer, is not described by the Bean model. (C) 1999 American In
stitute of Physics. [S0021-3640(99)00124-3].