Determination of short-range order and interlayer extension in Fe/Al multilayers using XAFS

Citation
Dc. Meyer et al., Determination of short-range order and interlayer extension in Fe/Al multilayers using XAFS, J PHYS D, 32(24), 1999, pp. 3135-3139
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS D-APPLIED PHYSICS
ISSN journal
00223727 → ACNP
Volume
32
Issue
24
Year of publication
1999
Pages
3135 - 3139
Database
ISI
SICI code
0022-3727(199912)32:24<3135:DOSOAI>2.0.ZU;2-R
Abstract
Shea-range order in Fe/Al multilayers has been determined using Fe K fluore scence x-ray absorption fine structure (XAFS) experiments. The two multilay ers studied (prepared by pulsed laser deposition) exhibited different Fe si ngle layer thickness (4.3 nm and 30 nm, respectively) but comparable total amount of Fe (six thin and one thick layers, respectively). From XAFS signa ls arising at different regions of the sample it was concluded that a solid solution of alpha-Fe had been formed in the vicinity of the Fe/Al interfac e, the thickness of which was estimated to be 3.8 nm. The average Fe neighb ourhood in these interface regions contained about 50% Al substituting for Fe.