Sn. Prasad et al., INDEXING OF DIFFRACTION PATTERNS AND INDENTIFICATION OF FAULT VECTOR IN DECAGONAL AL65CU20CO15 PHASE, Progress in crystal growth and characterization of materials, 34(1-4), 1997, pp. 175-182
Characterisations of defect structures such as pencil disorder, faulti
ng in quasiperiodic layers and dislocation in decagonal quasicrystals
has assumed importance currently. The first step towards a complete un
derstanding of these defects requires easy and unambiguous method of i
ndexing the diffraction patterns. The present study is devoted to this
task. New rules have been framed for an unambiguous indexing of the d
iffraction patterns following the model of Mandal and Lele. The scheme
is applied to the indexing of important electron diffraction patterns
from a decagonal Al-65 Cu-20 Co-15 alloy and the indices for the dire
ction of streaking ill some of the diffraction patterns have been foun
d and are of the type [001 (1) over bar 00].