Surface profiling using shearography

Citation
Hm. Shang et al., Surface profiling using shearography, OPT ENG, 39(1), 2000, pp. 23-31
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICAL ENGINEERING
ISSN journal
00913286 → ACNP
Volume
39
Issue
1
Year of publication
2000
Pages
23 - 31
Database
ISI
SICI code
0091-3286(200001)39:1<23:SPUS>2.0.ZU;2-U
Abstract
We review profile measurement methods using shearography. Traditionally, sh earography implies the use of small image shearing, which yields first-orde r derivatives of displacements or of spatial coordinates. We demonstrate th at the use of large image shearing is equivalent to holography, since displ acement-related, or spatial coordinate-related, phase fringes are generated . Hence, the technique of shearography can appropriately be perceived as an optical technique that directly measures displacements (or spatial coordin ates) and surface strains (or surface slopes). Unlike holography, shearogra phy does not require special vibration isolation since a separate reference beam is not required; hence, it is a practical tool that can be used in th e field/factory environment. Examples of the use of small and large image s hearing for surface profiling are given. Finally, a novel method for comput ing phase derivatives for the determination of curvatures of object surface s from shearographic measurements is discussed. (C) 2000 society of Photo-o ptical Instrumentation Engineers. [S0091-3286(00)00201-4].