Reported here is a study of the pattern of lattice curvature near the inter
face of deformed high-purity aluminium (99.9999%) bicrystals of specified c
rystallographic character (large-angle random). Curvature data are obtained
from electron back-scattering diffraction pattern observations using orien
tation imaging microscopy. The concept of geometrically necessary dislocati
ons (GNDs) is used as the central tool in the description of the observatio
ns. The samples studied were channel-die compressed perpendicular to the in
terface to plastic strain levels of 0.1 and 0.3. At a strain level of 0.1 t
he primary observation is the development of a pile-up of GNDs (i.e. lattic
e curvature) near the interface. At the higher strain level of 0.3, however
, a dramatic change in the distribution is observed. The nature of this cha
nge suggests that the interface has absorbed (or emitted) some components o
f the nearby GND field, with an accompanying change in the local character
of the interface towards a broader dispersion of misorientation character.