Transmission electron microscopy study of dislocations and extended defects in as-grown icosahedral Al-Pd-Mn single grains

Citation
D. Caillard et al., Transmission electron microscopy study of dislocations and extended defects in as-grown icosahedral Al-Pd-Mn single grains, PHIL MAG A, 80(1), 2000, pp. 237-253
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS ANDMECHANICAL PROPERTIES
ISSN journal
13642804 → ACNP
Volume
80
Issue
1
Year of publication
2000
Pages
237 - 253
Database
ISI
SICI code
1364-2804(200001)80:1<237:TEMSOD>2.0.ZU;2-U
Abstract
Analyses of transmission electron microscopy observations of dislocations a nd faults oriented in mirror planes of as-grown single grains of icosahedra l Al-Pd-Mn show that the Burgers vectors and associated fault vectors are p erpendicular to the fault planes. These results suggest that climb processe s have to be considered as realistic deformation modes at high temperatures in these materials.