Influence of the backward-pump process on photon-number squeezing in a constant-current-driven heterojunction LED: Transition from thermionic emission to diffusion limits
M. Kobayashi et al., Influence of the backward-pump process on photon-number squeezing in a constant-current-driven heterojunction LED: Transition from thermionic emission to diffusion limits, PHYS REV B, 60(24), 1999, pp. 16686-16700
Physical mechanisms which limit the squeezing bandwidth in a heterojunction
light-emitting diode (LED) have been extensively studied both theoreticall
y and experimentally. It is proven that our experimental results of pump-cu
rrent dependence of the squeezing bandwidth in the constant-current-driven
heterojunction LED at room temperature cannot be explained by previous theo
retical predictions. We present a theoretical framework, including the effe
cts of a microscopic backward-pump (BP) process, generally applicable to a
heterojunction LED. Parameters describing the relative significance of the
BP process are determined by the measurements of current-versus-voltage cha
racteristic and differential resistance of the LED, independent of the nois
e measurements. As a consequence, the experimental results can be explained
by our model in a unified manner ol er a whole range of injection current,
and it is clarified that the pump situation of the LED moves continuously
from thermionic emission to diffusion limits with increasing pump current.
[S0163-1829(99)09247-4].