Adsorption and growth of Xe adlayers on the Cu(111) surface

Citation
Jk. Park et al., Adsorption and growth of Xe adlayers on the Cu(111) surface, PHYS REV B, 60(24), 1999, pp. 16934-16940
Citations number
31
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
60
Issue
24
Year of publication
1999
Pages
16934 - 16940
Database
ISI
SICI code
0163-1829(199912)60:24<16934:AAGOXA>2.0.ZU;2-L
Abstract
The adsorption and growth of Xe layers on the Cu(111) surface were studied with a low-temperature scanning tunneling microscope. Initially, Xe atoms p referentially adsorb at the step, revealing two different wetting behaviors at the upper and the lower step edges at the coverage of <0.1 monolayer. T hree-dimensional island growth is followed on the terrace at the coverage o f >0.2 monolayer when grown at <20 K. The island growth is attributed to in homogeneous nucleation and lower diffusivity of Xe on the Xe monolayer than on the Cu(111) surface. The diffusion barriers, the two-dimensional barrie r on a terrace and the one-dimensional barrier along a step, and the step-d own barrier determine the growth morphology of Xe layers as the substrate t emperature was raised. [S0163-1829(99)00238-9].