Well-ordered GdFe2 alloy films of up to two ML thickness-were grown on top
of a W(110) substrate and characterized by using scanning tunneling microsc
opy/spectroscopy (STM/STS) and low-energy electron diffraction (LEED). The
crystallographic structure of the ultrathin films was found to be different
from the well-known bulk structure (C15 Laves phase). This is supposed to
result from the influence of the substrate on the growth behavior. Based on
atomically resolved STM images and LEED studies, a structure model for the
ultrathin GdFe2 films on W(110) is proposed. [S0163-1829(99)04347-7].