Probing domains at the nanometer scale in piezoelectric thin films

In this article, we describe nanometer scale characterization of piezoelect ric thin films of lead-zirconate-titanate. Using the electric field from a biased conducting atomic-force microscope tip, we show that it is possible to form and subsequently image ferroelectric domains. Using the cantilever in resonant mode, we show that it is also possible to map the surface-poten tial distribution. Using a sphere-plane model for the tip-sample system we calculate the distribution of electric potential, field and polarization ch arge, and find good agreement with the experimental values. We also discuss the effects of surface contaminants on domain formation. [S0163-1829(99)09 947-6].