c-axis penetration depth and interlayer conductivity in the thallium-basedcuprate superconductors

Citation
D. Dulic et al., c-axis penetration depth and interlayer conductivity in the thallium-basedcuprate superconductors, PHYS REV B, 60(22), 1999, pp. R15051-R15054
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
60
Issue
22
Year of publication
1999
Pages
R15051 - R15054
Database
ISI
SICI code
0163-1829(199912)60:22<R15051:CPDAIC>2.0.ZU;2-W
Abstract
The c-axis Josephson plasmons in optimally doped single-layer and bilayer h igh-T-c cuprates Tl2Ba2CuO6 and Tl2Ba2CaCu2O8 have been investigated using infrared spectroscopy. We observed the plasma frequencies for these two com pounds at 27.8 and 25.6 cm(-1) respectively, which we interpret as Josephso n resonances across the TlO blocking layers. No maximum in the temperature dependence of the c-axis conductivity was observed below T-c, indicating th at even in the superconducting state a coherent quasiparticle contribution to the c-axis conductivity is absent or very weak. [S0163-1829(99)51346-5].