Texture development of silver films made by ionised magnetron sputter depos
ition (LMSD) on a naturally oxidised Si(001) substrate has been studied. Th
e deposition technique used an r.f. coil to generate a high-density inducti
on plasma confined close to the substrate. A sufficient ion flux, containin
g ions of the sputtering gas and the depositing species, can easily be draw
n to the substrate with a substrate bias. Therefore, this process is able t
o provide controllable energetic ion bombardment, in terms of both flux (by
r.f. power) and energy (by substrate bias). Ion bombardment induced (111)
texture of silver films was characterised using the X-ray diffraction (XRD)
method. The texture: was investigated as a function of the operational par
ameters of IMSD, including gas pressure, ion Aux, ion incident energy and i
onisation fraction of depositing species. It was found that the texture was
sensitive to the energy per deposited atom, which was the product of the n
ormalised ion flux (total ion flux/total depositing flux) and incident ener
gy. By the precise control of ion bombardment during film growth, a method
to control film texture using the IMSD technique is presented. (C) 2000 Els
evier Science S.A. All rights reserved.