Dislocation propagation and defect evolution in GaN films formed by epitaxi
al lateral overgrowth (ELO) are examined by transmission electron microscop
y. A novel effect that induces self-organized propagation of preexisting di
slocations in ELO films is evaluated. This propagation forms dislocations i
nto bundle structures along the stripes of masks used for ELO. The dislocat
ion bundling gives rise to crystallographic tilting in the overgrown region
on the mask and leads to a total reduction of threading dislocation densit
y in the film. (C) 2000 American Institute of Physics. [S0003-6951(00)04504
-6].