Determination of scanning ranges and reflection dimensions on X-ray rotation patterns at high values of the Lorentz factor

Authors
Rubinskii, SV Kheiker, DM
Citation
Sv. Rubinskii et Dm. Kheiker, Determination of scanning ranges and reflection dimensions on X-ray rotation patterns at high values of the Lorentz factor, CRYSTALLO R, 44(6), 1999, pp. 1071-1073
Citations number
5
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CRYSTALLOGRAPHY REPORTS
ISSN journal
10637745 → ACNP
Volume
44
Issue
6
Year of publication
1999
Pages
1071 - 1073
Database
ISI
SICI code
1063-7745(199911/12)44:6<1071:DOSRAR>2.0.ZU;2-U
Abstract
A procedure was proposed for the analytical determination of scanning range s and dimensions of diffraction spots on X-ray rotation patterns within the framework of the Ewald model in the case where the rotation axis lies almo st in the diffraction plane. The procedure allows one to estimate the refle ction asymmetry and determine limiting angles gamma, at which integrated in tensities cannot be completely recorded.