Techniques minimize switching-device failures in inductive circuits

Citation
V. Lakshminarayanan, Techniques minimize switching-device failures in inductive circuits, EDN, 45(2), 2000, pp. 59-65
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
EDN
ISSN journal
00127515 → ACNP
Volume
45
Issue
2
Year of publication
2000
Pages
59 - 65
Database
ISI
SICI code
0012-7515(20000120)45:2<59:TMSFII>2.0.ZU;2-E