M. Silver et al., Design and ASE characteristics of 1550-nm polarization-insensitive semiconductor optical amplifiers containing tensile and compressive wells, IEEE J Q EL, 36(1), 2000, pp. 118-122
The polarization dependence of 1550-nm semiconductor optical amplifiers (SO
A's) containing tensile and compressive wells has been investigated both th
eoretically and experimentally, Our model to predict the polarization-resol
ved (TE and TM) gain spectra of these structures has been confirmed by ampl
ified spontaneous emission measurements, It is found that there can be appr
eciable carrier redistribution between the two types of wells when the tens
ile layers have the large thickness (greater than 100 Angstrom) needed for
gain at wavelengths around 1550 nm, This carrier redistribution can signifi
cantly modify the ratio of the gains for different polarizations, in partic
ular, decreasing the TM gain with respect to the TE gain, and, hence, is an
important design consideration. We use our model and experimental data to
explore design criteria for 1550-nm polarization-independent SOA's.