Editorial

Authors
Agrawal, VD
Citation
Vd. Agrawal, Editorial, J ELEC TEST, 16(1-2), 2000, pp. 5-5
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN journal
09238174 → ACNP
Volume
16
Issue
1-2
Year of publication
2000
Pages
5 - 5
Database
ISI
SICI code
0923-8174(2000)16:1-2<5:E>2.0.ZU;2-Y