Guest editorial

Authors
Abadir, M
Citation
M. Abadir, Guest editorial, J ELEC TEST, 16(1-2), 2000, pp. 9-10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN journal
09238174 → ACNP
Volume
16
Issue
1-2
Year of publication
2000
Pages
9 - 10
Database
ISI
SICI code
0923-8174(2000)16:1-2<9:GE>2.0.ZU;2-A