A scanning photoemission microscope (SPEM) to study the interface chemistry of AlTi/C system

Authors
Seal, S Warwick, T Sobczak, N Morgiel, J
Citation
S. Seal et al., A scanning photoemission microscope (SPEM) to study the interface chemistry of AlTi/C system, J MAT SCI L, 19(2), 2000, pp. 123-126
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
19
Issue
2
Year of publication
2000
Pages
123 - 126
Database
ISI
SICI code
0261-8028(200001)19:2<123:ASPM(T>2.0.ZU;2-8