For conventional open-gate FET-based sensors, such as the ISFETs, the influ
ence of light exposure is very sensitive. This drawback leading to change i
n the electrical characteristics. To reduce light-induced instability, the
optimized ISFET structure with a metal light shield is investigated in this
study. We used aluminum as a light shield and tin oxide as a pH sensitive
layer to develop the ISFET devices with SnO2/Al/SiO2/Si and compared to SnO
2/SiO2/Si ISFET sensors. The data show that ISFETs with an aluminum as a li
ght shield can maintain a linear pH response of about 56-58 mV per unit pH
in the pH range between 2 and 10, and have effectively decreased light sens
itivity tested under 15 mW (room light about 0.3 mW) irradiation at wavelen
gth of lambda = 550 nm compared to the ISFETs without an aluminum light shi
eld. (C) 2000 Elsevier Science S.A. All rights reserved.