Determination of interference-free optical constants of thin films

Authors
Mahanty, S Basak, D Merino, JM Leon, M
Citation
S. Mahanty et al., Determination of interference-free optical constants of thin films, MAT SCI E B, 68(2), 1999, pp. 72-75
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
68
Issue
2
Year of publication
1999
Pages
72 - 75
Database
ISI
SICI code
0921-5107(199912)68:2<72:DOIOCO>2.0.ZU;2-H
Abstract
A computational procedure has been developed for the accurate determination of interference-free optical constants (refractive index, n(l) and extinct ion coefficient, k(l)) of thin solid films from reflectance (R) and transmi ttance (T) measurements. By using (1 - R)/T function and a successive refin ement loop, error in calculation of the absorption coefficient (alpha) has been minimized. The method has been successfully used for the determination of optical constants and band Sap of CuIn1 - x GaxSe2 and Sb2S3 thin films . (C) 1999 Elsevier Science S.A. All rights reserved.