Trapped protons and electrons in the Earth's radiation belts and cosmic ray
s present significant challenges for electronics that must operate reliably
in the natural space environment. Single event effects (SEE) can lead to s
udden device or system failure, and total dose effects can reduce the lifet
ime of a space-based telecommunications system. One of the greatest sources
of uncertainty in developing radiation requirements for a space system is
accounting for the small but finite probability that the system will be exp
osed to a massive solar particle event, Once specifications are decided, st
andard laboratory tests are available to predict the total dose response of
MOS and bipolar components in space, but SEE testing of components can be
more challenging, Prospects are discussed for device modeling, and for the
use of commercial electronics in space. In addition: technology trends are
discussed for the radiation response of microelectronics in space. (C) 2000
Elsevier Science Ltd. All rights reserved.