An overview of radiation effects on electronics in the space telecommunications environment

Citation
Dm. Fleetwood et al., An overview of radiation effects on electronics in the space telecommunications environment, MICROEL REL, 40(1), 2000, pp. 17-26
Citations number
102
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
40
Issue
1
Year of publication
2000
Pages
17 - 26
Database
ISI
SICI code
0026-2714(200001)40:1<17:AOOREO>2.0.ZU;2-E
Abstract
Trapped protons and electrons in the Earth's radiation belts and cosmic ray s present significant challenges for electronics that must operate reliably in the natural space environment. Single event effects (SEE) can lead to s udden device or system failure, and total dose effects can reduce the lifet ime of a space-based telecommunications system. One of the greatest sources of uncertainty in developing radiation requirements for a space system is accounting for the small but finite probability that the system will be exp osed to a massive solar particle event, Once specifications are decided, st andard laboratory tests are available to predict the total dose response of MOS and bipolar components in space, but SEE testing of components can be more challenging, Prospects are discussed for device modeling, and for the use of commercial electronics in space. In addition: technology trends are discussed for the radiation response of microelectronics in space. (C) 2000 Elsevier Science Ltd. All rights reserved.