Densification of sol-gel TiO2 very thin films studied by SPR measurements

Authors
Plenet, JC Brioude, A Bernstein, E Lequevre, F Dumas, J Mugnier, J
Citation
Jc. Plenet et al., Densification of sol-gel TiO2 very thin films studied by SPR measurements, OPT MATER, 13(4), 2000, pp. 411-415
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
OPTICAL MATERIALS
ISSN journal
09253467 → ACNP
Volume
13
Issue
4
Year of publication
2000
Pages
411 - 415
Database
ISI
SICI code
0925-3467(200001)13:4<411:DOSTVT>2.0.ZU;2-C
Abstract
Very thin TiO2 films have been prepared by sol-gel and deposited on a silve r layer for Surface Plasmon Resonance (SPR) measurements. Densification of the samples has been studied by determining from SPR measurements the optic al index (ranging from 1.68 to 1.92) and thickness (ranging from 1.68 to 1. 92 nm) at each step of the annealing procedure. The structure of the layer (amorphous and/or crystalline) has been checked at the final stage of the t hermal treatment by High Resolution Transmission Electron Microscopy(HRTEM) . (C) 2000 Elsevier Science B.V.. All rights reserved.