Thermally stimulated exoelectronic emission of CVD diamond films

Citation
D. Briand et al., Thermally stimulated exoelectronic emission of CVD diamond films, THIN SOL FI, 359(2), 2000, pp. 150-153
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
359
Issue
2
Year of publication
2000
Pages
150 - 153
Database
ISI
SICI code
0040-6090(20000131)359:2<150:TSEEOC>2.0.ZU;2-8
Abstract
Exoemissive properties of several CVD diamond films (undoped or doped with nitrogen) are studied by the thermally stimulated exoelectronic emission (T SEE) method. Some experimental results are obtained after UV or X-ray irrad iation. After UV irradiation, a single TSEE peak is observed at 605 or 625 K, depending upon the growth parameters. The existence of the exoemission s ignal is related to the surface morphology: facetted surfaces give rise to exoelectronic emission, more especially in the presence of both 111 and 100 faces, while smooth surfaces do not or only to a limit extent. A possible indication of negative electron affinity is observed at about 273 K. (C) 20 00 Elsevier Science S.A. All rights reserved.