Effect of scattering on nonlinear optical scanning microscopy imaging of highly scattering media

Citation
Jp. Ying et al., Effect of scattering on nonlinear optical scanning microscopy imaging of highly scattering media, APPL OPTICS, 39(4), 2000, pp. 509-514
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
4
Year of publication
2000
Pages
509 - 514
Database
ISI
SICI code
0003-6935(20000201)39:4<509:EOSONO>2.0.ZU;2-K
Abstract
The intensity of two-photon excited fluorescence (TPF) generated by ultrash ort laser pulses was measured as a function of the depth of a focal point i nside highly scattering media. The purpose was to investigate the spatial l ocation of TPF in a scattering medium. Owing to the scattering, the intensi ty of the incident beam as well as the generated TPF signal wets attenuated exponentially as the focal point was scanned into the medium. As the scatt ering strength of the medium was increased, the TPF was not confined to the focal region and had a wider distribution. These observations show that th e scattering will result in the degradation of the ability of optical depth sectioning of nonlinear optical scanning microscopy. (C) 2000 Optical Soci ety of America.