Surface temperature-field imaging with laser-induced thermographic phosphorescence

Citation
Ac. Edge et al., Surface temperature-field imaging with laser-induced thermographic phosphorescence, APPL OPTICS, 39(4), 2000, pp. 546-553
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
4
Year of publication
2000
Pages
546 - 553
Database
ISI
SICI code
0003-6935(20000201)39:4<546:STIWLT>2.0.ZU;2-T
Abstract
A technique to remotely image temperature distributions of heated metallic surfaces is extended to higher temperatures. It uses a Dy'S:YAG thermograph ic phosphor (TP) bonded to the surface and excited by radiation at 355 nm. Digital images of the emission from two excited states were recorded and di vided by each other to correct by normalization for illumination and coatin g nonuniformities. Results show that the TP can survive heating and cooling cycles to 1400 K and that emitting states achieve thermodynamic equilibriu m before radiating. Temperatures in the range of 300-1300 K were determined by normalization of pairs of emission images with a single calibration con stant. Uncertainties of +/-7-13% at a spatial resolution of 20 mu m and +/- 0.7-4% at a resolution of 500 mu m were achieved. (C) 2000 Optical Society of America.