X-ray fluorescence spectrometry using the JRRM800 reference materials series and its application to the determination of spinel raw material components
H. Asakura et al., X-ray fluorescence spectrometry using the JRRM800 reference materials series and its application to the determination of spinel raw material components, BUNSEKI KAG, 49(1), 2000, pp. 21-28
In order to analyze spinel raw materials by X-ray fluorescence spectrometry
we applied JRRM800 series reference materials prepared by the Technical As
sociation of Refractories, Japan. The standard deviation (SD) of the calibr
ation curves, obtained by using JRRM800 series glass beads, are very satisf
actory: less than 0.1 mass% for the main components and less than 0.02 mass
% for impurities. The obtained reproducibilities (within-laboratory) amply
satisfied the permissible tolerance of each component in JIS R 2014 (method
for chemical analysis of Al2O3 - MgO). This analysis method could be appli
ed to the determination of Al2O3 from 95 to 50 mass% in commercial spinel r
aw materials. From the analytical results, it was shown that these spinels
were made from synthetic and/or natural raw materials of both alumina and m
agnesia sources.