DETERMINATION OF THE C-70 C-60 RATIO IN FULLERENE THIN-FILMS AS A FUNCTION OF THE SUBLIMATION DISTANCE AND THE SUBSTRATE-TEMPERATURE USING SCANNING-TUNNELING-MICROSCOPY

Authors
LANG HP HEEGER KM THOMMENGEISER V GUNTHERODT HJ
Citation
Hp. Lang et al., DETERMINATION OF THE C-70 C-60 RATIO IN FULLERENE THIN-FILMS AS A FUNCTION OF THE SUBLIMATION DISTANCE AND THE SUBSTRATE-TEMPERATURE USING SCANNING-TUNNELING-MICROSCOPY, Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties, 70(3), 1994, pp. 721-730
Citations number
24
Categorie Soggetti
Physics, Applied
Journal title
Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties → ACNP
ISSN journal
09586644
Volume
70
Issue
3
Year of publication
1994
Pages
721 - 730
Database
ISI
SICI code
0958-6644(1994)70:3<721:DOTCCR>2.0.ZU;2-C
Abstract
Thin fullerene films on Au(111) substrates have been prepared by evapo rating a mixture of C60 and C70 powders. The variation of the C70/C60 ratio as a function of the sublimation distance and the substrate temp erature has been studied by imaging the surface with molecular resolut ion using scanning tunnelling microscopy (STM). This procedure allows the C60 and C70 molecules on the surface to be counted and a local val ue of the C70/C60 ratio to be determined. Spectroscopy in UV and visib le ranges (UV-VIS) of fullerene solutions in n-hexane obtained by diss olving the fullerene films confirms the STM results. Both methods show an increase of the amount of C70 in the films with increasing substra te temperature and a decrease of the C70/C60 ratio with increasing sub limation distance.