Surfactant-encapsulated clusters (SECs): (DODA)(20)(NH4)[H3Mo57V6(NO)(6)O-183(H2O)(18)], a case study

Citation
Dg. Kurth et al., Surfactant-encapsulated clusters (SECs): (DODA)(20)(NH4)[H3Mo57V6(NO)(6)O-183(H2O)(18)], a case study, CHEM-EUR J, 6(2), 2000, pp. 385-393
Citations number
52
Categorie Soggetti
Chemistry
Journal title
CHEMISTRY-A EUROPEAN JOURNAL
ISSN journal
09476539 → ACNP
Volume
6
Issue
2
Year of publication
2000
Pages
385 - 393
Database
ISI
SICI code
0947-6539(200001)6:2<385:SC((>2.0.ZU;2-T
Abstract
We present a comprehensive study of the partially reduced polyoxomolybdate [H3Mo57V6(NO)(6)O-183(H2O)(18)](21-) encapsulated in a shell of dimethyldio ctadecylammonium (DODA) surfactant molecules. Treatment of an aqueous solut ion of (NH4)(21)[H3Mo57V6-(NO)(6)O-183(H2O)(18)]. 65H(2)O (1a) with a trich loromethane solution of the surfactant leads to instant transfer of the enc apsulated complex anion into the organic phase. Results from vibrational sp ectroscopy, analytical ultracentrifugation, small-angle X-ray scattering, t ransmission electron microscopy, elemental analysis, and Langmuir compressi on isotherms are consistent with a single polyoxometalate core encapsulated within a shell of 20 DODA molecules. The molar mass of the supramolecular assembly is 20 249 g mol(-1) and the diameter is 3.5nm. A material with the empirical formula (DODA)(20)(NH4)[H-3-Mo57V6(NO)(6)O-183(H2O)(18)] (2) was isolated as a dark violet solid, which readily dissolves in organic solven ts. Slow evaporation of solutions of 2 on solid substrates forces the hydro phobic particles to aggregate into a cubic lattice. Annealing these so-form ed films at elevated temperature causes de-wetting with terrace formation s imilar to liquid crystals and block copolymers. Compound 2 forms a stable L angmuir monolayer at the air-water interface; Langmuir-Blodgett multilayers are readily prepared by repeated transfer of monolayers on solid substrate s. The films were characterized by optical ellipsometry, Brewster angle mic roscopy, transmission electron microscopy, and X-ray reflectance.