Genetic algorithm based defect identification system

Authors
Tam, SM Cheung, KC
Citation
Sm. Tam et Kc. Cheung, Genetic algorithm based defect identification system, EXPER SY AP, 18(1), 2000, pp. 17-25
Citations number
8
Categorie Soggetti
AI Robotics and Automatic Control
Journal title
EXPERT SYSTEMS WITH APPLICATIONS
ISSN journal
09574174 → ACNP
Volume
18
Issue
1
Year of publication
2000
Pages
17 - 25
Database
ISI
SICI code
0957-4174(200001)18:1<17:GABDIS>2.0.ZU;2-M
Abstract
In this paper we develop a genetic algorithm based defect identification sy stem for machined-parts inspection purposes. The system is based on genetic algorithm and knowledge system techniques. (C) 2000 Elsevier Science Ltd. All rights reserved.